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BTAS ? 2015 IEEE 7th International Conference on Biometrics Theory, Applications and Systems

September 8, 2015 - September 11, 2015

The IEEE Seventh International Conference on Biometrics: Theory, Applications and Systems (BTAS 2015), a continuation of the highly successful BTAS conference series started in 2007, will be held in the September 8 – 11, 2015 time period in Arlington, Virginia in the Washington, DC area (USA). BTAS 2015 is a premier research conference focused on all aspects of biometrics. It is intended to have a broad scope, including advances in fundamental signal processing, image processing, pattern recognition, and statistical and mathematical techniques relevant to biometrics.

Areas of coverage include biometrics based on voice, fingerprint, iris, periocular, face, handwriting, gait and other modalities, as well as multi-modal biometrics and new biometrics based on novel sensing technologies. Submissions will be rigorously reviewed, and should clearly make the case for a documented improvement over existing state-of-art. Experimental results for contributions in established areas such as voice, face, iris, fingerprint, and gait are encouraged to use the largest and most challenging existing publicly available datasets.

Topics of interest include but are not limited to: 3D face recognition, anti-spoofing methods, biometric databases, biometric encryption, cancellable biometrics, covariate analysis, DNA biometrics, ear biometrics, face recognition, facial aging effects, fingerprint, gait, hand geometry, iris biometrics, large scale deployments, multi-biometric fusion, novel biometrics, novel sensors, ocular recognition, palmprint, performance evaluation, security and privacy, social impact analysis, soft biometrics, speaker recognition, template aging, template protection, usability studies and writer recognition.

Details

Start:
September 8, 2015
End:
September 11, 2015
Event Category:
Website:
http://btas2015.org/Home.html

Venue

Key Bridge Marriott
1401 Lee Hwy
Arlington, VA 22209 United States

Organizer

IEEE Biometrics Council
Email:
kwb@cse.nd.edu